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IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS 20-BIT BUFFER
IDT74FCT162827AT/CT
FEATURES:
* * * * * * * * * *
0.5 MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tSK(o) (Output Skew) < 250ps Low input and output leakage 1A (max.) ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) VCC = 5V 10% Balanced Output Drivers (24mA) Reduced system switching noise Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V, TA = 25C Available in SSOP and TSSOP packages
DESCRIPTION:
The FCT162827T 20-bit buffers are built using advanced dual metal CMOS technology. These 20-bit bus drivers provide high-performance bus interface buffering for wide data/address paths or buses carrying parity. Two pair of NAND-ed output enable controls offer maximum control flexibility and are organized to operate the device as two 10-bit buffers or one 20-bit buffer. Flowthrough organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin. The FCT162827T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times-reducing the need for external series terminating resistors. The FCT162827T is a plug-in replacement for the FCT16827T and ABT16827 for on-board interface applications.
FUNCTIONAL BLOCK DIAGRAM
1 1OE 1 1OE 2 56 2OE 1 2OE 2
28 29
55 1A 1
2 1Y 1 2A 1
42
15 2Y 1
TO NINE OTHER CHANNELS
TO NINE OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
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(c) 2002 Integrated Device Technology, Inc.
MAY 2002
DSC-5440/3
IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
1OE1 1Y1 1Y2
ABSOLUTE MAXIMUM RATINGS(1)
Symbol Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max -0.5 to 7 -0.5 to VCC+0.5 -65 to +150 -60 to +120 Unit V V C mA
56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29
1OE2 1A1 1A2
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
VTERM(2) VTERM(3) TSTG IOUT
GND
1Y3 1Y4
GND
1A3 1A4
VCC
1Y5 1Y6 1Y7
VCC
1A5 1A6 1A7
NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXX Output and I/O terminals. 3. Outputs and I/O terminals for FCT162XXX.
GND
1Y8 1Y9 1Y10 2Y1 2Y2 2Y3
GND
1A8 1A9 1A10 2A1 2A2 2A3
CAPACITANCE (TA = +25C, f = 1.0MHz)
Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 3.5 3.5 Max. 6 8 Unit pF pF
NOTE: 1. This parameter is measured at characterization but not tested.
GND
2Y4 2Y5 2Y6
GND
2A4 2A5 2A6
PIN DESCRIPTION
Pin Names xOEx xAx xYx Data Inputs 3-State Outputs Description Output Enable Inputs (Active LOW)
VCC
2Y7 2Y8
VCC
2A7 2A8
GND
2Y9 2Y10 2OE1
GND
2A9 2A10 2OE2
FUNCTION TABLE(1)
Inputs xOE1 L L H X
NOTE: 1. H = HIGH voltage level L = LOW voltage level X = Don't care Z = High-impedance
SSOP/ TSSOP TOP VIEW
Outputs xAx L H X X xYx L H Z Z
xOE2 L L X H
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IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Industrial: TA = -40C to +85C, VCC = 5.0V 10%
Symbol VIH VIL IIH IIL IOZH IOZL VIK IOS VH ICCL ICCH ICCZ Parameter Input HIGH Level Input LOW Level Input HIGH Current (Input pins)(4) Input HIGH Current (I/O pins)(4) Input LOW Current (Input pins)(4) Input LOW Current (I/O pins)(4) High Impedance Output Current (3-State Output pins)(4) Clamp Diode Voltage Short Circuit Current Input Hysteresis Quiescent Power Supply Current VCC = Max VIN = GND or VCC VCC = Min., IIN = -18mA VCC = Max., VO = GND(3) -- VCC = Max. VO = 2.7V VO = 0.5V VI = GND Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC Min. 2 -- -- -- -- -- -- -- -- -80 -- -- Typ.(2) -- -- -- -- -- -- -- -- -0.7 -140 100 5 Max. -- 0.8 1 1 1 1 1 1 -1.2 -250 -- 500 V mA mV A A Unit V V A
OUTPUT DRIVE CHARACTERISTICS
Symbol IODL IODH VOH VOL Parameter Output LOW Current Output HIGH Current Output HIGH Voltage Output LOW Voltage Test Conditions(1) VCC = 5V, VIN = VIH or VIL, VCC = 5V, VIN = VIH or VIL, VCC = Min. VIN = VIH or VIL VCC = Min. VIN = VIH or VIL
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. This test limit for this parameter is 5A at TA = -55C.
Min. 60 -60 2.4 --
Typ.(2) 115 -115 3.3 0.3
Max. 200 -200 -- 0.55
Unit mA mA V V
VO = 1.5V(3) VO = 1.5V(3) IOH = -24mA IOL = 24mA
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IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol ICC ICCD Parameter Quiescent Power Supply Current TTL Inputs HIGH Dynamic Power Supply Current(4) Test Conditions(1) VCC = Max. VIN = 3.4V(3) VCC = Max. Outputs Open xOE1 = xOE2 = GND One Input Toggling 50% Duty Cycle VCC = Max. Outputs Open fi = 10MHz 50% Duty Cycle xOE1 = xOE2 = GND One Bit Toggling VCC = Max. Outputs Open fi = 2.5MHz 50% Duty Cycle xOE1 = xOE2 = GND Twenty Bits Toggling VIN = VCC VIN = GND Min. -- -- Typ.(2) 0.5 60 Max. 1.5 100 Unit mA A/ MHz
IC
Total Power Supply Current(6)
VIN = VCC VIN = GND VIN = 3.4V VIN = GND VIN = VCC VIN = GND VIN = 3.4V VIN = GND
--
0.6
1.5
mA
--
0.9
2.3
--
3
5.5(5) 20.5(5)
--
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NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ICC DHNT + ICCD (fCPNCP/2 + fiNi) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fCP fi = Input Frequency Ni = Number of Inputs at fi
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IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT162827AT Symbol tPLH tPHL Parameter Propagation Delay xAx to xYx Condition(1) CL = 50pF RL = 500 CL = 300pF(4) RL = 500 CL = 50pF RL = 500 CL = 300pF(4) RL = 500 tPHZ tPLZ Output Disable Time xOEx to xYx CL = 5pF(4) RL = 500 CL = 50pF RL = 500 Min.(2) 1.5 1.5 1.5 1.5 1.5 1.5 -- Max. 8 15 12 23 9 10 0.5 FCT162827CT Min.(2) 1.5 1.5 .5 1.5 1.5 1.5 -- Max. 3.7 7 4.8 9 4 4 0.5 ns ns ns Unit ns
tPZH tPZL
Output Enable Time xOEx to xYx
tSK(o)
Output Skew(3)
NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design. 4. This limit is guaranteed but not tested.
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IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
V CC 500 VIN Pulse Generator RT D.U.T. 50pF CL 500 VOUT 7.0V
SWITCH POSITION
Test Open Drain Disable Low Enable Low All Other Tests Switch Closed Open
DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Test Circuits for All Outputs
DATA INPUT TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC.
tSU
tH
tREM
3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V
LOW-HIGH-LOW PULSE tW HIGH-LOW-HIGH PULSE
1.5V
1.5V
tSU
tH
Pulse Width
Set-up, Hold, and Release Times
ENABLE SAME PHASE INPUT TRANSITION tPLH OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL tPHL 3V 1.5V 0V VOH 1.5V VOL 3V 1.5V 0V CONTROL INPUT tPZL OUTPUT NORMALLY LOW OUTPUT NORMALLY HIGH SWITCH CLOSED tPZH SWITCH OPEN 1.5V 0V 0V 3.5V 1.5V tPHZ 0.3V VOH tPLZ DISABLE 3V 1.5V 0V 3.5V 0.3V VOL
Propagation Delay
Enable and Disable Times
NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns.
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IDT74FCT162827AT/CT FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT XX FCT Temp. Range XXX Family XXXX Device Type XX Package
PV PA
Shrink Small Outline Package Thin Shrink Small Outline Package
827AT 827CT
20-Bit Buffer
162 74
Double-Density, 5 Volt, Balanced Drive - 40C to +85C
DATA SHEET DOCUMENT HISTORY 1/21/2002 Removed Military temp grade 4/9/2002 Removed B speed option 5/21/2002 Removed TVSOP package
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for Tech Support: logichelp@idt.com (408) 654-6459
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